Development of a semi-automatic Beta-backscatter thickness-measuring system final report by R. V Heckman

Cover of: Development of a semi-automatic Beta-backscatter thickness-measuring system | R. V Heckman

Published by Dept. of Energy, for sale by the National Technical Information Service] in [Washington], [Springfield, Va .

Written in English

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Subjects:

  • Beta rays -- Scattering,
  • Thickness measurement,
  • Minicomputers

Edition Notes

Book details

StatementR. V. Heckman, Communications Services., Bendix, Kansas City Division
SeriesBDX ; 613-2102 (rev.)
ContributionsUnited States. Dept. of Energy, Bendix Corporation. Kansas City Division. Communications Services
The Physical Object
Pagination85 leaves :
Number of Pages85
ID Numbers
Open LibraryOL14863562M

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Get this from a library. Development of a semi-automatic Beta-backscatter thickness-measuring system: final report. [R V Heckman; United States. Department of Energy.; Bendix Corporation.

Kansas City Division. Communications Services.]. Development of a Pm source for beta-backscatter thickness gauge applications Author links open overlay panel Manoj Kumar a J. Udhayakumar a J. Nuwad b Rakesh Shukla b C.G.S. Pillai b Ashutosh Dash a Meera Venkatesh aCited by: 9.

Development of a Pm source for beta-backscatter thickness gauge applications. This paper describes a method for the preparation of ()Pm sources, utilized in the determination of graphite coating thickness on the inner surface of the zircaloy cladding tube of nuclear fuels.

Oct 30,  · Therefore, the thickness of many platings such as gold, tin, silver, rhodium, or platinum are easily measured by beta backscatter. Historically, beta backscatter systems were originally developed for—and used extensively in—the measurement of plating thickness on printed circuit boards and electronic components.

Beta backscatter measurement: Still viable after all these years. Author links open overlay panel Michael Justice (President). Show moreCited by: 2. Beta backscatter measurement: Still viable after all these years Article in Metal Finishing (10) · October with 14 Reads How we measure 'reads'.

BETA BACKSCATTERING BY METALLIC ELEMENTS AND SIMPLE COMPOUNDS I. Galloway George Watson’s College, Colinton Road, Edinburgh, Scotland, Great Britain The aim was to investigate the angular dependence of the -particle backscatter count rate, using a strontium source. In addition the empirical relationship between theCited by: 1.

The Universal Multi-Measuring System for Coating Thickness Measurement and Material Testing. ding to the radiometric beta-backscatter method, an Coating thickness measurement and material tes-ting with only one instrument. Apr 28,  · The vision of the BSWG is that: "Backscatter data acquired from differing sonar systems, or processed through differing software tools, generate consistent values over a same area under the same conditions; these data are scientifically meaningful and usable by end-users from all application domains (geoscience, environment, hydrography.

• Can be integrated in quality management systems and company networks Measurement by hand or automated • Support stand V12 MOT for semi-automatic meas- • Beta-backscatter method (DIN EN ISOASTM Ba) Measured quantities Coating thickness, electrical conductivity, ferrite content.

Beta Backscatter Technology Beta Backscatter (BSTM B & ISO /B) is a non-destructive, direct-contact method of coatings measurement. Beta backscatter instruments can measure coatings that have at least a 20% density difference from the coating and substrate.

38 CHAPTER 4 THE RADAR BACKSCATTERING COEFFICIENT Radiometric calibration of the microwave data is essential to convert the processed SAR data or images into measurements of radar back scatter of targets.

Jun Beta backscatter measurement for coating thickness. Hi all, I came across a technique that I wasn't previously aware of, was having a hard time finding any white papers on basic principles, and wondered if anyone has experience/knowledge in this area. Metallic and non-metallic coatings— Measurement of thickness — Beta backscatter method 1 Scope WARNING Beta backscatter instruments used for the measurement of coating thicknesses use a number of different radioactive sources.

Although the activities of these sources are normally very low, they can present a hazard to health, if incorrectly. P 2 diaphragm of the diagnostic machine. This distance corresponds to approximately 1m from the x-ray tube target.

Exposure measurements were carried out for field sizes of 10cm x10cm and 34cm x34cm at the chamber. This test method covers the beta backscatter gages for the nondestructive measurement of metallic and nonmetallic coatings on both metallic and nonmetallic substrate materials.

The test method measures the mass of coating per unit area, which can also be expressed in linear thickness units provided that the density of the coating is known. this experiment, you will investigate the absorption and backscattering of -particles by aluminum. Absorption If an object is placed between a -source and a Geiger counter, the counting rate will be reduced due to absorption of some of the -rays by the object; the.

How Backscatter X-ray Systems Work. by Nathan Chandler. NEXT PAGE. Traditional X-ray machines give a rough look at your body's density. Newfangled backscatter scanners show more exterior detail, making them useful for security purposes.

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(4) The ionization chamber current I i(θ) (due to a possible unmeasured background), ± 1%. (5) The target current I t (due to secondary emission from the target caused by bremsstrahlung, and re- backscattering of electrons from the walls of the scattering chamber to the target), ±%.

Semi-coherent Detection and Performance Analysis for Ambient Backscatter System Jing Qian, Feifei Gao, Gongpu Wang, Shi Jin, and Hongbo Zhu Abstract We study a novel communication mechanism, ambient backscatter, that utilizes radio frequency (RF) signals transmitted from an ambient source as both energy supply and information carrier toAuthor: Jing Qian, Feifei Gao, Gongpu Wang, Shi Jin, Hongbo Zhu.

This test method covers the nondestructive measurement of the mass per unit area of coating using beta backscatter gages. It also covers the measurement of the linear thickness if the coating density is known.

This test method applies to both metallic and nonmetallic coatings on both metallic and nonmetallic substrates. ASTM-B Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method - aperture, beta backscatter, coating thickness, isotope; ICS. Are you looking for more information regarding this and other subjects.

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In this paper, it designs a measuring system of bearing thickness which is based on the four elements of the measuring system. It's using v-shaped blocks to achieve high-precision semi-automatic positioning of the bearing.

It is using differential inductive sensor for measurement, the signal has processed by AD firstly, then through analog-to-digital conversion, the signal input into SCM.

The Z Backscatter system made by American Science and Engineering works differently from standard x-ray systems. Instead of relying on images created by the absorption and pass-through properties of the objects being X-rayed, the backscatter system picks up images produced when materials scatter X Author: Julia Layton.

2 Improving Connector Loss and Splice Loss OTDR Measurement Accuracy of a High Backscatter Coefficient (High K) Fiber Pigtail Theory Two different measurement principles are used here.

One principle refers to bidirectional measurement or averaging the losses for each direction to negate any changes in K from one side of the event to the other. Comparison of Beta Backscatter and X-ray Fluorescence Methods to Measure Coating Thickness Sergio Palomo1; Bernice Mills2 1STAR, Rutgers, The State University of New Jersey, 2Sandia National Laboratories, Livermore, California Beta backscatter (BB) and X-ray fluorescence (XRF) can both be.

Description: This test method covers the beta backscatter gages for the nondestructive measurement of metallic and nonmetallic coatings on both metallic and nonmetallic substrate materials.

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Beta backscatter instruments employ a number. INSTRUMENTATION TO MEASURE THE BACKSCATTERING COEFFICIENT bb FOR ARBITRARY PHASE FUNCTIONS A Dissertation by DAVID HAUBRICH Submitted to the Office of Graduate Studies of Texas A&M University in partial fulfillment of the requirements for the degree of DOCTOR OF PHILOSOPHY Approved by: Chair of Committee, Edward S.

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